Device Characterization at Cryogenic Temperatures for Quantum Computing

Accurate determination of S-parameters in a cryogenic environment benefits quantum computing by enabling characterisation of microwave waveforms, components, circuits, systems and networks. The UK’s National Physical Laboratory (NPL), has developed new microwave measurement capabilities at cryogenic temperatures to address the shortage of cryogenic microwave test and measurement facilities for quantum computing. This talk will focus on the various S-parameter measurement capabilities at NPL to characterise the microwave performance of connectorized devices and non-connectorised devices such as on-chip devices, and substrate materials at temperatures of tens of mK.